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Cited by 4
The Realization-Independent Testing Based on the Black Box Fault Models

Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
https://doi.org/10.1109/DSD.2008.11
Journal:  (2008), p. 626
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
https://doi.org/10.1109/DDECS.2007.4295315
Conference:  (2007), p. 1
8th Euromicro Conference on Digital System Design (DSD'05)
E. Bareisa, V. Jusas, K. Motiejunas, R. Seinauskas
https://doi.org/10.1109/DSD.2005.42
Conference:  (2005), p. 192
Test generation at the algorithm-level for gate-level fault coverage
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
https://doi.org/10.1016/j.microrel.2008.03.017
Journal:  Microelectronics Reliability Volume 48, Issue 7 (2008), p. 1093


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